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Mechanical abrasion as a low cost technique for contamination-free sample acquisition from contaminated (IVA clean) platforms

Mechanical abrasion as a low cost technique for contamination-free sample acquisition from contaminated (IVA clean) platforms

Dolgin, B.; Yarbrough, C.; Carson, J.; Troy, R.
URI: http://hdl.handle.net/2014/15881
Date: 2000-08-03
Citation: Space Missions, Systems, and Architecture
Big Sky, Montana, USA

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