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The effects of TID on wear-out of advanced flash memories

The effects of TID on wear-out of advanced flash memories

Nguyen, D.; Scheick, L.; Swift, G. M.; Guertin, S. M.
URI: http://hdl.handle.net/2014/15840
Date: 2000-07-06
Citation: Nuclear and Space Raddiation Effects Conference
Reno, Nevada, USA

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