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The effects of TID on wear-out of advanced flash memories
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The effects of TID on wear-out of advanced flash memories
Nguyen, D.
;
Scheick, L.
;
Swift, G. M.
;
Guertin, S. M.
URI:
http://hdl.handle.net/2014/15840
Date:
2000-07-06
Citation:
Nuclear and Space Raddiation Effects Conference
Reno, Nevada, USA
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JPL TRS 1992+
JPL TRS 1992+
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