Elemental Surface Analysis at Ambient Pressure

Feldman, J.; Wilcox,  J.; George,  T.; Barsic,  D.; Scherer,  A.

dc.contributor.author	Feldman, J.	en_US
dc.contributor.author	Wilcox, J.	en_US
dc.contributor.author	George, T.	en_US
dc.contributor.author	Barsic, D.	en_US
dc.contributor.author	Scherer, A.	en_US
dc.date.accessioned	2004-09-23T21:00:29Z
dc.date.available	2004-09-23T21:00:29Z
dc.date.issued	2000	en_US
dc.identifier.citation	Applied Physics Letters	en_US
dc.identifier.citation	USA	en_US
dc.identifier.clearanceno	00-1422	en_US
dc.identifier.uri	http://hdl.handle.net/2014/15705
dc.description.abstract	The development of a portable surface elemental analysis tool based on the excitation of characteristics x-rays at ambient pressure with an electron beam is described.	en_US
dc.format.extent	434280 bytes
dc.format.mimetype	application/pdf
dc.language.iso	en_US
dc.subject.other	atmospheric electron x-ray spectrometer XRF EDX EDAX surface analysis microprobe	en_US
dc.title	Elemental Surface Analysis at Ambient Pressure	en_US