JPL Technical Report Server

Elemental Surface Analysis at Ambient Pressure

Show simple item record Feldman, J. en_US Wilcox, J. en_US George, T. en_US Barsic, D. en_US Scherer, A. en_US 2004-09-23T21:00:29Z 2004-09-23T21:00:29Z 2000 en_US
dc.identifier.citation Applied Physics Letters en_US
dc.identifier.citation USA en_US
dc.identifier.clearanceno 00-1422 en_US
dc.description.abstract The development of a portable surface elemental analysis tool based on the excitation of characteristics x-rays at ambient pressure with an electron beam is described. en_US
dc.format.extent 434280 bytes
dc.format.mimetype application/pdf
dc.language.iso en_US
dc.subject.other atmospheric electron x-ray spectrometer XRF EDX EDAX surface analysis microprobe en_US
dc.title Elemental Surface Analysis at Ambient Pressure en_US

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