dc.contributor.author | Feldman, J. | en_US |
dc.contributor.author | Wilcox, J. | en_US |
dc.contributor.author | George, T. | en_US |
dc.contributor.author | Barsic, D. | en_US |
dc.contributor.author | Scherer, A. | en_US |
dc.date.accessioned | 2004-09-23T21:00:29Z | |
dc.date.available | 2004-09-23T21:00:29Z | |
dc.date.issued | 2000 | en_US |
dc.identifier.citation | Applied Physics Letters | en_US |
dc.identifier.citation | USA | en_US |
dc.identifier.clearanceno | 00-1422 | en_US |
dc.identifier.uri | http://hdl.handle.net/2014/15705 | |
dc.description.abstract | The development of a portable surface elemental analysis tool based on the excitation of characteristics x-rays at ambient pressure with an electron beam is described. | en_US |
dc.format.extent | 434280 bytes | |
dc.format.mimetype | application/pdf | |
dc.language.iso | en_US | |
dc.subject.other | atmospheric electron x-ray spectrometer XRF EDX EDAX surface analysis microprobe | en_US |
dc.title | Elemental Surface Analysis at Ambient Pressure | en_US |