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Elemental Surface Analysis at Ambient Pressure

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dc.contributor.author Feldman, J. en_US
dc.contributor.author Wilcox, J. en_US
dc.contributor.author George, T. en_US
dc.contributor.author Barsic, D. en_US
dc.contributor.author Scherer, A. en_US
dc.date.accessioned 2004-09-23T21:00:29Z
dc.date.available 2004-09-23T21:00:29Z
dc.date.issued 2000 en_US
dc.identifier.citation Applied Physics Letters en_US
dc.identifier.citation USA en_US
dc.identifier.clearanceno 00-1422 en_US
dc.identifier.uri http://hdl.handle.net/2014/15705
dc.description.abstract The development of a portable surface elemental analysis tool based on the excitation of characteristics x-rays at ambient pressure with an electron beam is described. en_US
dc.format.extent 434280 bytes
dc.format.mimetype application/pdf
dc.language.iso en_US
dc.subject.other atmospheric electron x-ray spectrometer XRF EDX EDAX surface analysis microprobe en_US
dc.title Elemental Surface Analysis at Ambient Pressure en_US


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