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Atomic Force Microscope for Planetary Applications

Show simple item record Pike, W. en_US Hecht, M. en_US Akiyanna, T. en_US Gautsch, S. en_US Staufer, U. en_US Rooij, N. de en_US Niedermann, P. en_US Howard, L. en_US Muller, D. en_US Tonin, A. en_US Hidber, H. en_US 2004-09-23T20:49:07Z 2004-09-23T20:49:07Z 2000-06-06 en_US
dc.identifier.citation Sensors and Actuators 2000 en_US
dc.identifier.citation Hilton Head, SC, USA en_US
dc.identifier.clearanceno 00-1257 en_US
dc.format.extent 581461 bytes
dc.format.mimetype application/pdf
dc.language.iso en_US
dc.subject.other Atomic Force Microscope Mars Particles Array en_US
dc.title Atomic Force Microscope for Planetary Applications en_US

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