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Atomic Force Microscope for Planetary Applications

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dc.contributor.author Pike, W. en_US
dc.contributor.author Hecht, M. en_US
dc.contributor.author Akiyanna, T. en_US
dc.contributor.author Gautsch, S. en_US
dc.contributor.author Staufer, U. en_US
dc.contributor.author Rooij, N. de en_US
dc.contributor.author Niedermann, P. en_US
dc.contributor.author Howard, L. en_US
dc.contributor.author Muller, D. en_US
dc.contributor.author Tonin, A. en_US
dc.contributor.author Hidber, H. en_US
dc.date.accessioned 2004-09-23T20:49:07Z
dc.date.available 2004-09-23T20:49:07Z
dc.date.issued 2000-06-06 en_US
dc.identifier.citation Sensors and Actuators 2000 en_US
dc.identifier.citation Hilton Head, SC, USA en_US
dc.identifier.clearanceno 00-1257 en_US
dc.identifier.uri http://hdl.handle.net/2014/15556
dc.format.extent 581461 bytes
dc.format.mimetype application/pdf
dc.language.iso en_US
dc.subject.other Atomic Force Microscope Mars Particles Array en_US
dc.title Atomic Force Microscope for Planetary Applications en_US


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