Feasibility of a Miniature, Low-Voltage Scanning Electron Microscope for In-Situ Applications

dc.contributor.author	Callas, J.	en_US
dc.date.accessioned	2004-09-23T17:33:33Z
dc.date.available	2004-09-23T17:33:33Z
dc.date.issued	2000	en_US
dc.identifier.citation	Applied Physics Letters	en_US
dc.identifier.citation	USA	en_US
dc.identifier.clearanceno	00-0305	en_US
dc.identifier.uri	http://hdl.handle.net/2014/13928
dc.format.extent	1260791 bytes
dc.format.mimetype	application/pdf
dc.language.iso	en_US
dc.subject.other	in-situ applications scanning electron microscope	en_US
dc.title	Feasibility of a Miniature, Low-Voltage Scanning Electron Microscope for In-Situ Applications	en_US