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Feasibility of a Miniature, Low-Voltage Scanning Electron Microscope for In-Situ Applications

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dc.contributor.author Callas, J. en_US
dc.date.accessioned 2004-09-23T17:33:33Z
dc.date.available 2004-09-23T17:33:33Z
dc.date.issued 2000 en_US
dc.identifier.citation Applied Physics Letters en_US
dc.identifier.citation USA en_US
dc.identifier.clearanceno 00-0305 en_US
dc.identifier.uri http://hdl.handle.net/2014/13928
dc.format.extent 1260791 bytes
dc.format.mimetype application/pdf
dc.language.iso en_US
dc.subject.other in-situ applications scanning electron microscope en_US
dc.title Feasibility of a Miniature, Low-Voltage Scanning Electron Microscope for In-Situ Applications en_US


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