JPL Technical Report Server
Modification of GaN Schottky Barrier Interfaces Probed by Ballistic-Electron-Emission Microscopy and Spectroscopy
Login
JPL TRS Home
→
JPL Technical Report Server
→
JPL TRS 1992+
→
View Item
JavaScript is disabled for your browser. Some features of this site may not work without it.
Modification of GaN Schottky Barrier Interfaces Probed by Ballistic-Electron-Emission Microscopy and Spectroscopy
Bell, L.
;
Smith, R.
;
McDermott, B.
;
Gertner, E.
;
Pittman, R.
;
Pierson, R.
;
Sullivan, G.
URI:
http://hdl.handle.net/2014/13816
Date:
2000
Citation:
Applied Physics Letters
USA
Abstract:
Ballistic-electron-emission microscopy (BEEM) and spectroscopy have been used to investigate the properties of Au/GaN interfaces.
Show full item record
Items in TRS are protected by copyright, but are furnished with U.S. government purpose use rights.
Files in this item
Name:
00-0188.pdf
Size:
758.1Kb
Format:
PDF
View/
Open
This item appears in the following Collection(s)
JPL TRS 1992+
JPL TRS 1992+
Search
Search
This Collection
Browse
All Content
Communities & Collections
By Issue Date
Authors
Titles
Subjects
This Collection
By Issue Date
Authors
Titles
Subjects
My Account
Login
Register