Quantum metrology

Dowling, J.P.; Boto, A. N.; Abrams, D. S.; Braunstein, S. L.; Kok, P.; Hockney, G. H.; Lee, H.; Kulikov, I. K.; Yurtsever, U. H.; Strekalov, D. V.; Williams, C. P.
URI: http://hdl.handle.net/2014/13607
Date: 2002-01-05
Citation: Workshop on Physics of Quantum Electronics
Snowbird, UT, USA

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