Overview of non-volatile testing and screening methods

dc.contributor.author	Irom, F.	en_US
dc.date.accessioned	2004-09-23
dc.date.available	2004-09-23
dc.date.issued	2001-11-07	en_US
dc.identifier.citation	Non-volatile Memory Technology Symposium 2001	en_US
dc.identifier.citation	San Diego, CA, USA	en_US
dc.identifier.clearanceno	01-2370	en_US
dc.identifier.uri	http://hdl.handle.net/2014/13432
dc.description.abstract	This paper outlines several testing issues posed by novel memories and approaches to testing for radiation and reliability effects.	en_US
dc.format.extent	462352 bytes
dc.format.mimetype	application/pdf
dc.language.iso	en_US
dc.subject.other	non-volatile testing screening methods	en_US
dc.title	Overview of non-volatile testing and screening methods	en_US