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Overview of non-volatile testing and screening methods

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dc.contributor.author Irom, F. en_US
dc.date.accessioned 2004-09-23
dc.date.available 2004-09-23
dc.date.issued 2001-11-07 en_US
dc.identifier.citation Non-volatile Memory Technology Symposium 2001 en_US
dc.identifier.citation San Diego, CA, USA en_US
dc.identifier.clearanceno 01-2370 en_US
dc.identifier.uri http://hdl.handle.net/2014/13432
dc.description.abstract This paper outlines several testing issues posed by novel memories and approaches to testing for radiation and reliability effects. en_US
dc.format.extent 462352 bytes
dc.format.mimetype application/pdf
dc.language.iso en_US
dc.subject.other non-volatile testing screening methods en_US
dc.title Overview of non-volatile testing and screening methods en_US


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