Assessing application vulnerability to radiation-induced SEUs in RAM

dc.contributor.author	Springer, P. L.	en_US
dc.date.accessioned	2004-09-22T23:48:12Z
dc.date.available	2004-09-22T23:48:12Z
dc.date.issued	2001-06	en_US
dc.identifier.citation	The International Conference on Dependable Systems and Networks	en_US
dc.identifier.citation	Goteburg, Sweden	en_US
dc.identifier.clearanceno	01-1356	en_US
dc.identifier.uri	http://hdl.handle.net/2014/12951
dc.format.extent	208502 bytes
dc.format.mimetype	application/pdf
dc.language.iso	en_US
dc.subject.other	radiation SEU software vulnerability	en_US
dc.title	Assessing application vulnerability to radiation-induced SEUs in RAM	en_US