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Assessing application vulnerability to radiation-induced SEUs in RAM

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dc.contributor.author Springer, P. L. en_US
dc.date.accessioned 2004-09-22T23:48:12Z
dc.date.available 2004-09-22T23:48:12Z
dc.date.issued 2001-06 en_US
dc.identifier.citation The International Conference on Dependable Systems and Networks en_US
dc.identifier.citation Goteburg, Sweden en_US
dc.identifier.clearanceno 01-1356 en_US
dc.identifier.uri http://hdl.handle.net/2014/12951
dc.format.extent 208502 bytes
dc.format.mimetype application/pdf
dc.language.iso en_US
dc.subject.other radiation SEU software vulnerability en_US
dc.title Assessing application vulnerability to radiation-induced SEUs in RAM en_US


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