JPL Technical Report Server

Modeling defect trends for iterative development at JPL

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dc.contributor.author Powell, J. D. en_US
dc.date.accessioned 2004-09-20T19:50:35Z
dc.date.available 2004-09-20T19:50:35Z
dc.date.issued 2003-06-17 en_US
dc.identifier.citation Fourth Joint Annual ISPA/SCEA International Conference en_US
dc.identifier.citation Orlando, FL, USA en_US
dc.identifier.clearanceno 02-3201 en_US
dc.identifier.uri http://hdl.handle.net/2014/11253
dc.format.extent 1089397 bytes
dc.format.mimetype application/pdf
dc.language.iso en_US
dc.subject.other defects metrics en_US
dc.title Modeling defect trends for iterative development at JPL en_US


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