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Modeling defect trends for iterative development at JPL
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Modeling defect trends for iterative development at JPL
Powell, J. D.
URI:
http://hdl.handle.net/2014/11253
Date:
2003-06-17
Citation:
Fourth Joint Annual ISPA/SCEA International Conference
Orlando, FL, USA
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JPL TRS 1992+
JPL TRS 1992+
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