JPL Technical Report Server

Advanced methodology for capturing product metadata

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dc.contributor.author Rengarajan, K. en_US
dc.contributor.author Abajian, M. en_US
dc.contributor.author Dehghani, N. en_US
dc.contributor.author Jones, J. en_US
dc.contributor.author Sun, Q. en_US
dc.contributor.author Vu, Q. en_US
dc.date.accessioned 2004-09-17T19:42:43Z
dc.date.available 2004-09-17T19:42:43Z
dc.date.issued 2002-11-04 en_US
dc.identifier.citation JPL IT Symposium en_US
dc.identifier.citation Pasadena, CA, USA en_US
dc.identifier.clearanceno 02-2810 en_US
dc.identifier.uri http://hdl.handle.net/2014/10948
dc.format.extent 2717750 bytes
dc.format.mimetype application/pdf
dc.language.iso en_US
dc.subject.other xml metadata en_US
dc.title Advanced methodology for capturing product metadata en_US


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