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Reliability and endurance of FRAM: a case study

Show simple item record Namkung, J. en_US Patel, J. en_US 2004-09-17T19:03:30Z 2004-09-17T19:03:30Z 2002-11-04 en_US
dc.identifier.citation Non-volatile Memory Technology Symposium 2002 en_US
dc.identifier.citation Honolulu, HI, USA en_US
dc.identifier.clearanceno 02-2779 en_US
dc.description.abstract This paper describes a case study quantifying reliability and endurance results of two FRAM nonvolatile memories. en_US
dc.format.extent 2032773 bytes
dc.format.mimetype application/pdf
dc.language.iso en_US
dc.subject.other FRAM non-volatile memory reliability single-event upsets SEU en_US
dc.title Reliability and endurance of FRAM: a case study en_US

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