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Reliability and endurance of FRAM: a case study

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dc.contributor.author Namkung, J. en_US
dc.contributor.author Patel, J. en_US
dc.date.accessioned 2004-09-17T19:03:30Z
dc.date.available 2004-09-17T19:03:30Z
dc.date.issued 2002-11-04 en_US
dc.identifier.citation Non-volatile Memory Technology Symposium 2002 en_US
dc.identifier.citation Honolulu, HI, USA en_US
dc.identifier.clearanceno 02-2779 en_US
dc.identifier.uri http://hdl.handle.net/2014/10677
dc.description.abstract This paper describes a case study quantifying reliability and endurance results of two FRAM nonvolatile memories. en_US
dc.format.extent 2032773 bytes
dc.format.mimetype application/pdf
dc.language.iso en_US
dc.subject.other FRAM non-volatile memory reliability single-event upsets SEU en_US
dc.title Reliability and endurance of FRAM: a case study en_US


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