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Browsing by Subject "NAND circuits"

Browsing by Subject "NAND circuits"

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  • Nguyen, D. N.; Guertin, S. M.; Patterson, J. D. (IEEE, 2006-07)
    We report on SEE and TID tests of highly scaled Samsung 2Gbits flash memories. Both in-situ and biased interval irradiations were used to characterize the response of the total accumulated dose failures. The radiation-induced ...