JPL Technical Report Server

Browsing by Author "LaBel, K. A."

Browsing by Author "LaBel, K. A."

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  • Guertin, S. M.; Allen, G. R.; McClure, S. S.; LaBel, K. A. (Pasadena, CA : Jet Propulsion Laboratory, National Aeronautics and Space Administration, 2013, 2013-07-09)
    TID testing of 4th generation iPads is reported. Of iPad subsystems, results indicate that the charging circuitry and display drivers fail at lowest TID levels. Details of construction are investigated for additional testing ...